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US Patent 7924973 Interferometer device and method

Overview Structured Data Issues Contributors Activity

Is a

1

Date Filed

November 12, 2008

1

Date of Patent

April 12, 2011

1

Patent Application Number

12269449

1

Patent Citations Received

US Patent 11992350 System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector

2

US Patent 11686692 High throughput 3D x-ray imaging system using a transmission x-ray source

3

US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer

4

Patent Inventor Names

Christian Kottler

1

Rolf Kaufmann

1

Patent Jurisdiction

United States Patent and Trademark Office

1

Patent Number

1

Patent Primary Examiner

Irakli Kiknadze

1

Industry

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