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US Patent 7924973 Interferometer device and method
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Patent
1
Date Filed
November 12, 2008
1
Date of Patent
April 12, 2011
1
Patent Application Number
12269449
1
Patent Citations Received
US Patent 11992350 System and method for compact laminography utilizing microfocus transmission x-ray source and variable magnification x-ray detector
2
US Patent 11686692 High throughput 3D x-ray imaging system using a transmission x-ray source
3
US Patent 11885755 X-ray sequential array wavelength dispersive spectrometer
4
Patent Inventor Names
Christian Kottler
1
Rolf Kaufmann
1
Patent Jurisdiction
United States Patent and Trademark Office
1
Patent Number
7924973
1
Patent Primary Examiner
Irakli Kiknadze
1
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