US Patent 7929132 Transmission microscopy using light emitted from nanoparticles

Systems and methods for performing transmission microscopy on a sample material are disclosed. The sample material is placed on a metal nanoparticle substrate. High intensity light, such as an infrared laser, is focused on the nanoparticle substrate, thereby exciting the silver nanoparticles. The excited nanoparticles emit intensely focused, spectrally broad white light that is able to pass through the sample material without significant scattering even when the sample material is highly diffuse. The emitted light that passes through the sample material is detected and used to generate images and characterize features of the sample material, including the internal structural composition of the sample material.