Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Sun-Mo An0
Shin-Ho Chun0
Date of Patent
May 10, 2011
0Patent Application Number
121686110
Date Filed
July 7, 2008
0Patent Primary Examiner
Patent abstract
The embodiments described herein are directed to providing a multi-column decoder stress test circuit capable of reducing a column stress test time while sufficiently performing a stress test by using column selection signals. The multi-column decoder stress test circuit comprising a control unit configured to receive at least one column test signal and to generate a multi-column enable signal, and a multi-enable decoding unit configured to receive the multi-column enable signal and to generate a plurality of enabled column selection signals.
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