Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Wen-Wu Tseng0
Date of Patent
May 24, 2011
0Patent Application Number
123893750
Date Filed
February 20, 2009
0Patent Primary Examiner
Patent abstract
A method for testing a storage apparatus, which includes: (a) writing a specific pattern to a storage unit of a storage apparatus; (b) reading the specific pattern written to the storage apparatus; (c) determining an error bit number of the specific pattern read in the step (b); and (d) determining that the storage unit has defect when the error bit number is larger than a error bit threshold value, wherein the error bit threshold value is smaller than a correctable bit number for a error correction code corresponding to the specific pattern.
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