Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Tzu-Jin Yeh0
Hsiao-Tsung Yen0
Sally Liu0
Date of Patent
May 31, 2011
0Patent Application Number
120426060
Date Filed
March 5, 2008
0Patent Primary Examiner
Patent abstract
A method and system for de-embedding an on-wafer device is disclosed. The method comprises representing the intrinsic characteristics of a test structure using a set of ABCD matrix components; determining the intrinsic characteristics arising from the test structure; and using the determined intrinsic characteristics of the test structure to produce a set of parameters representative of the intrinsic characteristics of a device-under-test (“DUT”).
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