US Patent 7969168 Integrated circuit with built-in self test circuit
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Patent abstract
An embodiment of the invention provides an integrated circuit. The integrated circuit has an analog device-under-test (DUT), a memory receiving and storing a test program and a processor. The processor tests the analog DUT and outputs a test result in digital format by executing the test program, wherein the test result indicates whether the analog DUT workable according to a specification.
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Patent Inventor Names
Chun-Yu Lin0
Hsin-Yi Chen0
Kang-Nin Lin0
Shiue-Shin Liu0
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US Patent 07969168 Integrated circuit with built-in self test circuit US Patent 7969168 Integrated circuit with built-in self test circuit
Infobox
Patent Number
079691680
Patent Number
79691680
Edits on 7 Apr, 2023
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
079691680
Date of Patent
June 28, 2011
0Patent Application Number
121370290
Date Filed
June 11, 2008
0Patent Primary Examiner
Edits on 8 Dec, 2021
Golden AI
Edits made to:
Infobox (+7 properties)
US Patent 07969168 Integrated circuit with built-in self test circuit
Infobox
Is a
Patent jurisdiction
Patent number
07969168
Date of patent
June 28, 2011
Patent application number
12137029
Date Filed
June 11, 2008
Patent primary examiner
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