US Patent 7973544 Thermal monitoring and management of integrated circuits

Patent 7973544 was granted and assigned to Agere Systems on July, 2011 by the United States Patent and Trademark Office.

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Patent

Patent attributes

Current Assignee

Agere Systems

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

79735440

Patent Inventor Names

Seung H. Kang0

Vance D. Archer, III0

Taeho Kook0

Warren K. Gladden0

Vivian Ryan0

Daniel P. Chesire0

Sailesh M. Merchant0

Date of Patent

July 5, 2011

Patent Application Number

121947060

Date Filed

August 20, 2008

Patent Primary Examiner

‌

Minh N. Tang

Patent abstract

The invention, in one aspect, provides a semiconductor device (100), including transistors (105), dielectric layers (115, 120) located over the transistors (105), interconnects (122) formed within the dielectric layers (115, 120), and a test structure (130) located adjacent a hot-spot (125) of the semiconductor device (100) and configured to monitor a real-time operational parameter of at least one of the transistors (105) or interconnects (122).

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