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US Patent 8003535 Semiconductor device manufacturing method and target substrate processing system

Patent 8003535 was granted and assigned to Tokyo Electron on August, 2011 by the United States Patent and Trademark Office.

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Patent

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Current Assignee
Tokyo Electron
Tokyo Electron
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8003535
Date of Patent
August 23, 2011
Patent Application Number
12173350
Date Filed
July 15, 2008
Patent Primary Examiner
‌
Jack Chen
Patent abstract

A semiconductor device manufacturing method includes removing copper deposits, by use of an organic acid gas and an oxidizing gas, from a surface of a second interlayer insulation film having a groove formed therein and reaching a copper-containing electric connector member. The second interlayer insulation film is disposed on a first interlayer insulation film provided with the electric connector member. The method then includes reducing a surface of the electric connector member exposed at a bottom of the groove of the second interlayer insulation film; forming a barrier layer on the second interlayer insulation film; and forming a copper-containing conductive film to fill the groove of the second interlayer insulation film.

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