US Patent 8009787 Method for non-destructive testing
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Patent abstract
Non-destructive testing method may include providing a source material that emits positrons in response to bombardment of the source material with photons. The source material is exposed to photons. The source material is positioned adjacent the specimen, the specimen being exposed to at least some of the positrons emitted by the source material. Annihilation gamma rays emitted by the specimen are detected.
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Patent Inventor Names
Douglas W. Akers0
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US Patent 08009787 Method for non-destructive testing US Patent 8009787 Method for non-destructive testing
Infobox
Patent Number
080097870
Patent Number
80097870
Edits on 26 Mar, 2023
Golden AI
Infobox
Is a
Patent Jurisdiction
Patent Number
080097870
Date of Patent
August 30, 2011
0Patent Application Number
108697940
Date Filed
June 15, 2004
0Patent Primary Examiner
Edits on 8 Dec, 2021
Golden AI
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US Patent 08009787 Method for non-destructive testing
Infobox
Is a
Patent jurisdiction
Patent number
08009787
Date of patent
August 30, 2011
Patent application number
10869794
Date Filed
June 15, 2004
Patent primary examiner
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