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US Patent 8012331 Probe and method of making same

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
October 22, 2007
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Date of Patent
September 6, 2011
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Patent Application Number
11876180
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Patent Citations Received
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US Patent 11973301 Probes having improved mechanical and/or electrical properties for making contact between electronic circuit elements and methods for making
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US Patent 11761982 Probes with planar unbiased spring elements for electronic component contact and methods for making such probes
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US Patent 11774467 Method of in situ modulation of structural material properties and/or template shape
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US Patent 11802891 Compliant pin probes with multiple spring segments and compression spring deflection stabilization structures, methods for making, and methods for using
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US Patent 11867721 Probes with multiple springs, methods for making, and methods for using
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US Patent 11906549 Compliant pin probes with flat extension springs, methods for making, and methods for using
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Patent Inventor Names
Jung-Hoon Lee
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Oug-Ki Lee
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
8012331
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Patent Primary Examiner
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Luan Van
0

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