Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Edward J. Yarmchuk0
Michael A. Gaynes0
Date of Patent
September 27, 2011
0Patent Application Number
128432110
Date Filed
July 26, 2010
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A process for measuring the thickness of an insulating material. The process includes providing a device used to measure capacitance, and electrically connecting the capacitance measuring device to a heat sink and an electrical, heat-generating component. The thickness of the insulating material is determined by measuring the capacitance of the insulating material according to tile formula: B=∈r∈oA/C, where B is the thickness of the insulating material, C is tile capacitance, A is the area of tile heat generating component, ∈o is the permittivity of free space and ∈r is the relative dielectric constant of the insulating material.
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