Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
David Wald0
Muhammad Arshad Khan0
Tim Wakeling0
Date of Patent
October 25, 2011
0Patent Application Number
121433620
Date Filed
June 20, 2008
0Patent Citations Received
Patent Primary Examiner
Patent abstract
In general, a method includes determining metric values associated with data quality for one or more child nodes. Metric values are determined for a parent node based on the metric values of at least some of the child nodes, and relationships between one or more parent nodes and one or more child nodes define a hierarchy. The determination of the metric value for the parent node is repeated for multiple instances.
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