US Patent 8121817 Abnormal event detection using principal component analysis
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Process control system for detecting abnormal events in a process having one or more independent variables and one or more dependent variables. The system includes a device for measuring values of the one or more independent and dependent variables, a process controller having a predictive model for calculating predicted values of the one or more dependent variables from the measured values of the one or more independent variables, a calculator for calculating residual values for the one or more dependent variables from the difference between the predicted and measured values of the one or more dependent variables, and an analyzer for performing a principal component analysis on the residual values. The process controller is a multivariable predictive control means and the principal component analysis results in the output of one or more scores values, T2 values and Q values.
US Patent 08121817 Abnormal event detection using principal component analysis US Patent 8121817 Abnormal event detection using principal component analysis
US Patent 08121817 Abnormal event detection using principal component analysis
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