Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
David White0
Louis K. Scheffer0
Date of Patent
February 21, 2012
0Patent Application Number
121474360
Date Filed
June 26, 2008
0Patent Citations Received
Patent Primary Examiner
Patent abstract
The present invention allows for a robust design using manufacturability models. A method, system and/or computer usable medium may be provided in an integrated circuit design to track sensitivity to a variation of process from wafer to wafer and/or fab to fab in order to assist the designers to anticipate the variations to improve the final yield of the products.
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