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US Patent 8151163 Automatic defect management in memory devices

Patent 8151163 was granted and assigned to Anobit Technologies on April, 2012 by the United States Patent and Trademark Office.

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Patent
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Patent attributes

Current Assignee
Anobit Technologies
Anobit Technologies
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
81511630
Patent Inventor Names
Dotan Sokolov0
Ofir Shalvi0
Date of Patent
April 3, 2012
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Patent Application Number
119958120
Date Filed
December 3, 2007
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Patent Citations Received
‌
US Patent 11869618 Memory sub-system including an in-package sequencer to perform error correction and memory testing operations
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Patent Primary Examiner
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Esaw Abraham
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Patent abstract

A method for storing data in a memory (28) that includes analog memory cells (32) includes identifying one or more defective memory cells in a group of the analog memory cells. An Error Correction Code (ECC) is selected responsively to a characteristic of the identified defective memory cells. The data is encoded using the selected ECC and the encoded data is stored in the group of the analog memory cells. In an alternative method, an identification of one or more defective memory cells among the analog memory cells is generated. Analog values are read from the analog memory cells in which the encoded data were stored, including at least one of the defective memory cells. The analog values are processed using an ECC decoding process responsively to the identification of the at least one of the defective memory cells, so as to reconstruct the data.

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