Patent attributes
An optical transceiver calibration system and manufacturing method to fabricate a dual closed loop control transceiver are provided. The calibration system and method includes measuring an operating temperature and determining operational parameters based upon the operating temperature. The operational parameters may include, for example, a target power for transmitting a digital one, a target power for transmitting a digital zero, a modulation current, and a bias current. A bias may be added to the temperature to account for the difference between the temperature at the temperature sensor and the optical equipment. The operational parameters are preferably calculated independently of each other and are used as initial values during operating modes and allow the control loop to converge more quickly. The optics data is may be scanned electronically via bar code or some other electronic format prior to test. The software residing on the module then calibrates and configures the transceiver.
