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US Patent 8263977 TFT substrate and TFT substrate manufacturing method
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Edits on 30 Oct, 2024
"update inverses"
Golden AI
edited on 30 Oct, 2024
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Patent Citations Received
US Patent 12132121 Semiconductor device and manufacturing method thereof
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Edits on 4 Sep, 2024
"update inverses"
Golden AI
edited on 4 Sep, 2024
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+1
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Patent Citations Received
US Patent 12080802 Semiconductor device comprising silicon and oxide semiconductor in channel formation region
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Edits on 21 Jun, 2023
"update inverses"
Golden AI
edited on 21 Jun, 2023
Edits made to:
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+1
properties)
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Patent Citations Received
US Patent 11682678 Liquid crystal display device and method for manufacturing the same
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Edits on 25 May, 2023
"Remove leading 0 from patent number"
Golden AI
edited on 25 May, 2023
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US Patent 08263977 TFT substrate and TFT substrate manufacturing method
US Patent 8263977 TFT substrate and TFT substrate manufacturing method
Infobox
Patent Number
08263977
0
0
Patent Number
8263977
0
0
Edits on 4 Apr, 2023
"Entity importer update"
Golden AI
edited on 4 Apr, 2023
Infobox
Is a
Patent
0
Patent Jurisdiction
United States Patent and Trademark Office
0
Patent Number
08263977
0
Date of Patent
September 11, 2012
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Patent Application Number
12095681
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Date Filed
November 30, 2006
0
Patent Primary Examiner
Edward Wojciechowicz
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Edits on 23 Sep, 2022
"Entity importer update"
Golden AI
edited on 23 Sep, 2022
Infobox
Is a
Patent
0
Patent Jurisdiction
United States Patent and Trademark Office
0
Patent Number
08263977
0
Date of Patent
September 11, 2012
0
Patent Application Number
12095681
0
Date Filed
November 30, 2006
0
Patent Primary Examiner
Edward Wojciechowicz
0
Edits on 15 Dec, 2021
"Created via: Entity Importer"
Golden AI
created this topic on 15 Dec, 2021
Edits made to:
Infobox
(
+7
properties)
US Patent 08263977 TFT substrate and TFT substrate manufacturing method
Infobox
Is a
Patent
Patent jurisdiction
United States Patent and Trademark Office
Patent number
08263977
Date of patent
September 11, 2012
Patent application number
12095681
Date Filed
November 30, 2006
Patent primary examiner
Edward Wojciechowicz
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