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US Patent 8279439 Birefringence measuring device and birefringence measuring method

Patent 8279439 was granted and assigned to Tokyo Denki University on October, 2012 by the United States Patent and Trademark Office.

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Patent Inventor Names

Kenji Gomi0

Date of Patent

October 2, 2012

Patent Application Number

124394410

Date Filed

June 14, 2007

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