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US Patent 8284896 Multiview x-ray inspection system
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Patent
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Date Filed
October 26, 2009
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Date of Patent
October 9, 2012
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Patent Application Number
12588705
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Patent Citations Received
US Patent 12121384 Systems and methods for x-ray imaging tissue specimens
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US Patent 11977037 Insert for screening tray
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US Patent 11986170 Tissue imaging in presence of fluid during biopsy procedure
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US Patent 12019035 Material detection in x-ray security screening
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US Patent 12104997 Multi-axis specimen imaging device with embedded orientation markers
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US Patent 11877877 Imaging system with adaptive object magnification
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US Patent 11885752 Calibration method and device therefor
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Patent Inventor Names
Satpal Singh
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Patent Jurisdiction
United States Patent and Trademark Office
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Patent Number
8284896
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Patent Primary Examiner
Irakli Kiknadze
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