US Patent 8327201 Parallel testing of an integrated circuit that includes multiple dies

Patent 8327201 was granted and assigned to Xilinx on December, 2012 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Current Assignee

Xilinx

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

83272010

Patent Inventor Names

Andrew W. Lai0

Date of Patent

December 4, 2012

Patent Application Number

127746680

Date Filed

May 5, 2010

Patent Citations Received

‌

US Patent 11755804 Hybrid synchronous and asynchronous control for scan-based testing

‌

US Patent 11860224 Interposer instrumentation method and apparatus

Patent Primary Examiner

‌

John Trimmings

No article content yet.

Timeline

No Timeline data yet.

Further Resources

Title

Author

Link

Type

Date

No Further Resources data yet.

References

Find more entities like US Patent 8327201 Parallel testing of an integrated circuit that includes multiple dies

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.

Open Query Tool

Access by API