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US Patent 8401270 Examination of a region using dual-energy radiation
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Patent
Date Filed
June 15, 2009
Date of Patent
March 19, 2013
Patent Application Number
12484709
Patent Citations Received
US Patent 12019035 Material detection in x-ray security screening
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US Patent 11707246 Method and apparatus for automatic determination of object and background region of interest for real-time automatic dose rate control in dynamic imaging systems
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US Patent 11885752 Calibration method and device therefor
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US Patent 11977037 Insert for screening tray
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Patent Inventor Names
David Perticone
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Jeff Stillson
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Richard F. Eilbert
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Shuanghe Shi
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Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
8401270
Patent Primary Examiner
Matthew Bella
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