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US Patent 8422303 Early degradation detection in flash memory using test cells

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Patent
Patent
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Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
84223030
Patent Inventor Names
Richard Leo Galbraith0
Luiz M. Franca-Neto0
Travis Roger Oenning0
Date of Patent
April 16, 2013
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Patent Application Number
129300200
Date Filed
December 22, 2010
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Patent Citations Received
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US Patent 11868621 Data storage with multi-level read destructive memory
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US Patent 12112821 Read destructive memory wear leveling system
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Patent Primary Examiner
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Michael Tran
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Patent abstract

A Flash memory system and a method for data management using the embodiments of the invention use special test cells with Early Degradation Detection (EDD) circuitry instead of using the actual user-data storage cells are described. The Flash memory test cells can be made to serve as a “canary in a coal mine” by being made more sensitive than the standard cells by using experimentally determined sensitive write VT and variable read VT. Techniques for early degradation detection (EDD) in Flash memories measure the dispersion of the threshold voltages (VT's), of a set (e.g. page) of NAND Flash memory cells during read operations. In an embodiment of the invention the time-to-completion (TTC) values for the read operation for the memory cells are used as a proxy for dispersion of the threshold voltages (VT's). A Dispersion Analyzer determines the dispersion of the set of TTC values.

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