US Patent 8468871 System and method for monitoring parameters in containers

A system for measuring parameters in a container is disclosed. A system for measuring multiple parameters includes a container having a solution, at least one sensor in conjunction with a tag is in proximity to an impedance analyzer and a reader that constitute a measurement device. The at least one sensor is configured to determine at least one parameter of the solution. The tag is configured to provide a digital ID associated with the sensor, where the container is in proximity to the reader and an impedance analyzer. The impedance analyzer is configured to send and receive a given range of frequencies from the sensor, based on the parameter and calculate parameter changes based on the response.