US Patent 8552756 Chip testing apparatus and testing method thereof
Patent 8552756 was granted and assigned to MStar Semiconductor on October, 2013 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
August 26, 2009
Date of Patent
October 8, 2013
Patent Application Number
12547555
Patent Citations Received
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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