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US Patent 8584056 Fast freeform source and mask co-optimization method

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Patent
Patent

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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8584056
Date of Patent
November 12, 2013
Patent Application Number
13130548
Date Filed
November 20, 2009
Patent Citations Received
‌
US Patent 11886124 Flows of optimization for patterning processes
0
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US Patent 11972194 Method for determining patterning device pattern based on manufacturability
0
Patent Primary Examiner
‌
Stacy Whitmore
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