Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
David L. Ferguson0
Rafael C. Camarota0
Geoffrey Richmond0
Date of Patent
April 29, 2014
0Patent Application Number
131872510
Date Filed
July 20, 2011
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A method of characterizing a die can include correlating, using a processor, a static voltage profile of a die under test in wafer form with a plurality of test static voltage profiles. The plurality of test static voltage profiles can be associated with dynamic performance profiles. The method further can include predicting dynamic performance of the die under test according to the dynamic performance profile associated with a test static voltage profile that is correlated with the static voltage profile.
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