Is a
Patent attributes
Patent Jurisdiction
Patent Number
Date of Patent
May 13, 2014
Patent Application Number
12302055
Date Filed
May 22, 2007
Patent Citations Received
Patent Primary Examiner
Patent abstract
The present invention relates to a system and method for non-invasively examination of internal structures of an object by producing dielectric images utilizing reflection and transmission 5 measurements using microwave radiation, characterized by an antenna array surrounding a region of interest for the examination, a microwave transceiver for measuring reflected and transmitted electromagnetic fields, a computational module for receiving detected radiation and for processing data based on the detected radiation, the computational module further being operatively arranged to execute a reconstruction procedure utilized to compute an image of the 10 dielectric profile under detection.
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