US Patent 8742339 Mass spectrometer

A mass analyzer is provided comprising a plurality of electrodes having apertures through which ions are transmitted. A plurality of pseudo-potential corrugations are created along the axis of the mass analyzer. The amplitude or depth of the pseudo-potential corrugations is inversely proportional to the mass to charge ratio of an ion. Transient DC voltages are applied to the electrodes in order to urge ions along the length of the mass analyzer. The amplitude of the transient DC voltages applied to the electrodes is increased with time and ions are caused to be emitted from the mass analyzer in reverse order of their mass to charge ratio. Two AC or RF voltages are applied to the electrodes. The first AC or RF voltage is arranged to provide optimal pseudo-potential corrugations while the second AC or RF voltage is arranged to provide optimal radial confinement of ions within the mass analyzer.