US Patent 8762095 System for concurrent test of semiconductor devices
Patent 8762095 was granted and assigned to Teradyne on June, 2014 by the United States Patent and Trademark Office.
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Patent Inventor Names
Bethany Van Wagenen0
Seng J. Edward0
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US Patent 08762095 System for concurrent test of semiconductor devices US Patent 8762095 System for concurrent test of semiconductor devices
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Patent Number
08762095
Patent Number
8762095
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Official Website
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US Patent 08762095 System for concurrent test of semiconductor devices
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Is a
Current assignee
Patent jurisdiction
Patent number
08762095
Date of patent
June 24, 2014
Patent application number
13100889
Date Filed
May 4, 2011
Patent primary examiner
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