Golden has been acquired by ComplyAdvantage.Read about it here ⟶

‌

US Patent 8786825 Apparatus and method of measuring a property of a substrate

Overview Structured Data Issues Contributors Activity

Is a

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

Date of Patent

July 22, 2014

Patent Application Number

12936327

Date Filed

April 20, 2009

Patent Citations Received

US Patent 11774828 Supercontinuum radiation source and associated metrology devices

US Patent 12104891 Spatially filtered talbot interferometer for wafer distortion measurement

0

US Patent 12007700 Metrology system and method for determining a characteristic of one or more structures on a substrate

0

Patent Primary Examiner

No article content yet.

Timeline

No Timeline data yet.

Further Resources

Title

Author

Link

Type

Date

No Further Resources data yet.

References

Find more entities like US Patent 8786825 Apparatus and method of measuring a property of a substrate

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.

Open Query Tool

Golden Query Tool