US Patent 8804911 Nondestructive inspection system using nuclear resonance fluorescence

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Is a

Patent

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

8804911

Patent Inventor Names

Takehito Hayakawa0

Toshiyuki Shizuma0

Hideaki Ohgaki0

Hiroyuki Toyokawa0

Nobuhiro Kikuzawa0

Ryoichi Hajima0

Date of Patent

August 12, 2014

Patent Application Number

13254835

Date Filed

March 4, 2010

Patent Citations Received

‌

US Patent 11877379 Apparatus and method for guiding charged particles

Patent Primary Examiner

‌

Allen C. Ho

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