US Patent 8922230 3D IC testing apparatus

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Patent Jurisdiction

Patent Number

Patent Inventor Names

Hao Chen0

Mill-Jer Wang0

Chih-Chia Chen0

Ching-Nen Peng0

Hung-Chih Lin0

Date of Patent

December 30, 2014

Patent Application Number

13105603

Date Filed

May 11, 2011

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