Patent attributes
Diagnostic tools for testing integrated circuit (IC) devices, and a method of making the same. The first diagnostic tool includes a first compliant printed circuit with a plurality of contact pads configured to form an electrical interconnect at a first interface between proximal ends of contact members in the socket and contact pads on a printed circuit board (PCB). A plurality of printed conductive traces electrically couple to a plurality of the contact pads on the first compliant printed circuit. A plurality of electrical devices are printed on the first compliant printed circuit at a location external to the first interface. The electrical devices are electrically coupled to the conductive traces and programmed to provide one or more of continuity testing at the first interface or functionality of the IC devices. A second diagnostic tool includes a second compliant printed circuit electrically coupled to a surrogate IC device.
