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US Patent 8990760 Cell-aware fault model generation for delay faults

Patent 8990760 was granted and assigned to Mentor Graphics on March, 2015 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Mentor Graphics
Mentor Graphics
Date Filed
August 26, 2011
Date of Patent
March 24, 2015
Patent Application Number
13219564
Patent Citations Received
‌
US Patent 11994559 Tests for integrated circuit (IC) chips
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8990760
Patent Primary Examiner
‌
Naum B Levin

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