US Patent 9003880 Reference speed measurement for a non-destructive testing system

A system includes a non-destructive testing (NDT) system having an NDT probe and a processor. The NDT probe includes a testing sensor and a motion sensor. The testing sensor is configured to capture sensor data from an inspection area, and the motion sensor is configured to detect a measurement speed at which the NDT probe moves relative to the inspection area. The processor is configured to determine a speed comparison between the measurement speed and a reference speed range.