Patent attributes
A computerized inspection system is described for detecting the presence of non-uniformity defects and providing output indicative of a severity of each type of non-uniformity defect. Techniques are described that increase the throughput of the inspection system. Algorithmic and hardware approaches are described to significantly decrease the average amount of time required to inspect a given quantity of material that is expected to be mostly uniform. The techniques described herein involve dynamic selection of which image features to compute by starting with a base feature set and only triggering additional feature computations as needed until the features are sufficient to compute a severity for each type of non-uniformity defect. The number of features extracted and the order in which the features are extracted is dynamically determined in real-time to reduce a cost associated with the feature extraction.
