US Patent 9036781 Amplified backscatter x-ray inspection system
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Patent abstract
A method and apparatus for inspecting an object. A radiation generation system is configured to emit radiation. A detector system is configured to detect backscatter formed in response to the radiation encountering the object. A redirection system is positioned relative to the detector system and is configured to redirect the backscatter to the detector system.
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Patent Inventor Names
Morteza Safai0
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US Patent 09036781 Amplified backscatter x-ray inspection system US Patent 9036781 Amplified backscatter x-ray inspection system
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Patent Number
090367810
Patent Number
90367810
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Patent Jurisdiction
Patent Number
090367810
Date of Patent
May 19, 2015
0Patent Application Number
136507330
Date Filed
October 12, 2012
0Official Website
Patent Primary Examiner
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US Patent 09036781 Amplified backscatter x-ray inspection system
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Is a
Patent jurisdiction
Patent number
09036781
Date of patent
May 19, 2015
Patent application number
13650733
Date Filed
October 12, 2012
Patent primary examiner
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