US Patent 9165653 Determining sector status in a memory device

The present disclosure includes methods, devices, modules, and systems for operating semiconductor memory. A number of method embodiments include reading data from memory cells corresponding to a sector of data, determining a number of the memory cells in a non-erased state, and, if the number of the memory cells in a non-erased state is less than or equal to a number of errors correctable by an ECC engine, determining the sector is erased.