Patent attributes
Disclosed are methods and apparatus for detecting defects in a semiconductor sample. The system includes an illumination optics module for simultaneously scanning two or more structured illumination (SI) patterns across the sample in a scan direction. The SI patterns have a phase shift with respect to each other, and the SI patterns are parallel to the scan direction. The system also includes a collection optics module for collecting output light from the sample in response to the SI patterns that are scanned across the sample and two or more detectors for individually detecting the output light collected for individual ones of the SI patterns. The system includes a controller to generate two or more SI images for the SI patterns based on the individually detected output light and detect defects on the sample by performing a comparison type inspection process based on the two or more SI images.
