An electronic asymmetric unclonable function applied to an electronic system being evaluated includes an electronic system and an AUF array electronically associated with the electronic system. The AUF array includes a plurality of non-identical cells. Each of the non-identical cells includes a test element representing a characteristic of the electronic system being evaluated and a measurement device evaluating the test element. A comparison unit processes an output of the measurement device to provide a multi-bit output value representing a magnitude of differences.