Patent attributes
An X-ray Talbot interferometer includes a first grating configured to diffract X-rays from an X-ray source and form an interference pattern, a second grating configured to block a portion of X-rays that form the interference pattern, and a detector configured to detect X-rays from the second grating. An inspection object is disposed between the X-ray source and the second grating. The second grating includes a first shield grating portion in which a shield portion and a transmissive portion are arranged periodically at a first period and a second shield grating portion. The first period is expressed as ps×n×Ls/(Ls+Lf), where ps denotes a size of pixels that the detector has, n denotes a positive integer, Ls denotes a distance from the X-ray source to the first shield grating portion, and Lf denotes a distance from the first shield grating portion to the detector.
