US Patent 9241627 Method and analysis system for eye examinations

An ophthalmological analysis system for examining an eye, in particular in the region of a front eye section of an eye includes first and second analysis systems obtaining sectional images of the eye. The first analysis system includes a projection device and a monitoring device arranged relative to each other according to the Scheimpflug rule. The second analysis system is an optical coherence interferometer. A processing device processes a first image data set obtained by the first analysis system and a second image data set obtained by the second analysis system to supplement the first image data set, at least partially, with data of the second image data set.