Patent attributes
A system for stand-off inspection comprising local positioning system hardware and a nondestructive evaluation instrument supported by a pan-tilt mechanism. The system further comprises a computer system that is programmed to perform the following operations: (a) directing the local positioning system hardware toward an area of a surface on a target object by control of the pan-tilt mechanism; (b) activating the local positioning system hardware to acquire an image; (c) processing the image to determine whether an anomaly is present in the area; (d) if an anomaly is present, determining coordinates of a position of the anomaly in a coordinate system of the target object; and (e) directing the nondestructive evaluation instrument toward a position corresponding to the coordinates. Optionally, the computer system is further programmed to measure one or more characteristics of the anomaly.
