Patent attributes
A method of sampling sensor data from a computing system is presented. The computing system includes a plurality of components and a sensor network for monitoring the computing system. The sensor network includes primary sensor nodes operable to obtain primary parameter data from a measurement of a primary parameter of the components, and secondary sensor nodes operable to obtain secondary parameter data from a measurement of secondary parameters of the components. The method includes: a) obtaining secondary parameter data from secondary sensor nodes relating to components; b) processing, in a computing device, the secondary parameter data; c) determining, based upon determined or pre-determined relationships between the secondary parameters and the primary parameter, a sample rate for the primary parameter data for the components; and d) obtaining primary parameter data from the primary sensor nodes relating to components at the determined sample rate.
