US Patent 9324545 Calibrating dual ADC acquisition system

A method of calibrating a dual gain ADC detector system is disclosed comprising passing a test signal through a high gain signal path to produce a first signal and passing a test signal through a low gain signal path to produce a second signal. A time difference between the first signal and the second signal is then determined. Data from the two ADCs is then stitched to form a composite mass spectrum without needing to correct the phase between the two ADCs.