Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Guang-Hai Jin0
Kwan-Wook Jung0
Seong-Jun Kim0
Sung-Soo Choi0
Ga-Young Kim0
Jae-Beom Choi0
Jee-Hoon Kim0
June-Woo Lee0
Date of Patent
June 7, 2016
0Patent Application Number
136720310
Date Filed
November 8, 2012
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A method of inspecting a short circuit defect between first wires extending in a first direction and a second direction intersecting the first direction and second wires extending in the first or second direction, the method including inspecting a short circuit defect between the first and second wires by using a potential difference monitored only in the second wires.
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