US Patent 9400291 Integrated circuit test temperature control mechanism
Patent 9400291 was granted and assigned to Intel on July, 2016 by the United States Patent and Trademark Office.
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Patent abstract
A thermal controller includes a thermal control interface to receive test data from an automated test equipment (ATE) system and dynamically adjust a target setpoint temperature based on the data and a dynamic thermal controller to receive the target setpoint temperature from the thermal control interface and control a thermal actuator based on the target setpoint temperature.
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Patent Inventor Names
Abram M. Detofsky0
James E. Neeb0
James G. Maveety0
John C. Johnson0
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US Patent 09400291 Integrated circuit test temperature control mechanism US Patent 9400291 Integrated circuit test temperature control mechanism
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Patent Number
094002910
Patent Number
94002910
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Is a
Current Assignee
Patent Jurisdiction
Patent Number
094002910
Date of Patent
July 26, 2016
0Patent Application Number
136004860
Date Filed
August 31, 2012
0Official Website
Patent Primary Examiner
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US Patent 09400291 Integrated circuit test temperature control mechanism
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
09400291
Date of patent
July 26, 2016
Patent application number
13600486
Date Filed
August 31, 2012
Patent primary examiner
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