Patent attributes
Disclosed non-destructive inspection methods comprise non-contact determination of the location of a non-destructive inspection probe and identification of the location on a test structure where test data is acquired by the probe. Determination may include capturing the positions of the probe and the test structure with one or more electronic cameras. Identification may include associating the acquired test data with the location of the probe relative to the test structure. Further, methods may comprise visualization of the test data relative to the identified location. Disclosed non-destructive inspection systems comprise a probe, one or more electronic cameras, a computer, and a display, together configured to determine the location of the probe, to acquire test data with the probe, to identify a location on a test structure associated with the test data, and to visualize the test data in relation to the test structure.
