US Patent 9423454 Test circuit and semiconductor apparatus including the same

A test circuit of a semiconductor apparatus includes a plurality of pads, a pattern generator configured to generate at least one internal test pattern in response to at least one pattern select signal, and a plurality of test units configured to transmit the at least one internal test pattern through the plurality of pads in response to a self test mode signal, and to compare the at least one test pattern received via the plurality of pads with the at least one generated internal test pattern and generate at least one test determination value based on the comparison.