US Patent 9583567 III-V gate-all-around field effect transistor using aspect ratio trapping

A field effect transistor includes a trench in a field dielectric material on a crystalline silicon substrate and source/drain features inside the trench. The field effect transistor further includes a channel feature comprising a III-V material in the trench and spanning between the source/drain features, and gate dielectric layers and a gate feature surrounding a portion of the channel feature.